Invention Grant
- Patent Title: Method and apparatus for checking current density limitation
- Patent Title (中): 检查电流密度限制的方法和装置
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Application No.: US11979834Application Date: 2007-11-08
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Publication No.: US08448125B2Publication Date: 2013-05-21
- Inventor: Kenichi Ushiyama
- Applicant: Kenichi Ushiyama
- Applicant Address: JP Yokohama
- Assignee: Fujitsu Semiconductor Limited
- Current Assignee: Fujitsu Semiconductor Limited
- Current Assignee Address: JP Yokohama
- Agency: Staas & Halsey LLP
- Priority: JP2007-19264 20070130
- Main IPC: G06F17/50
- IPC: G06F17/50
Abstract:
A method of checking a current density limitation includes checking the current density limitation of a power supply wiring based on an allowable current value, the allowable current value depending on the number of vias connected to the power supply wiring.
Public/Granted literature
- US20080184177A1 Method and apparatus for checking current density limitation Public/Granted day:2008-07-31
Information query
