Invention Grant
- Patent Title: Pipelined ADC calibration
- Patent Title (中): 流水线ADC校准
-
Application No.: US13124780Application Date: 2009-10-19
-
Publication No.: US08451154B2Publication Date: 2013-05-28
- Inventor: Christophe Erdmann , Arnaud Antoine Paul Biallais
- Applicant: Christophe Erdmann , Arnaud Antoine Paul Biallais
- Applicant Address: US CA San Jose
- Assignee: Integrated Device Technology, inc.
- Current Assignee: Integrated Device Technology, inc.
- Current Assignee Address: US CA San Jose
- Agency: Hayes and Boone LLP
- Priority: EP08290994 20081022; WOPCT/IB2009/054583 20091019
- International Application: PCT/IB2009/054583 WO 20091019
- International Announcement: WO2010/046831 WO 20100429
- Main IPC: H03M1/06
- IPC: H03M1/06

Abstract:
A method of calibrating a pipelined analog to digital converter having a plurality of DAC elements and an additional calibration DAC element is provided. In the method as provided herein, a combination of positive, negative and zero reference voltages are applied to the element under calibration and positive and negative reference voltages are applied to the additional calibration DAC element to obtain four calibration states. An error of the DAC element under calibration is extracted by calculating an average of the difference between the four calibration states.
Public/Granted literature
- US20110199244A1 Pipelined ADC Calibration Public/Granted day:2011-08-18
Information query