Invention Grant
- Patent Title: Exposure method and exposure apparatus
- Patent Title (中): 曝光方法和曝光装置
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Application No.: US12301984Application Date: 2006-06-07
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Publication No.: US08451426B2Publication Date: 2013-05-28
- Inventor: Jin Iino
- Applicant: Jin Iino
- Applicant Address: JP
- Assignee: V Technology Co., Ltd.
- Current Assignee: V Technology Co., Ltd.
- Current Assignee Address: JP
- Agency: Kolisch Hartwell, P.C.
- International Application: PCT/JP2006/311434 WO 20060607
- International Announcement: WO2007/141852 WO 20071213
- Main IPC: G03B27/32
- IPC: G03B27/32 ; G01B11/00 ; G03F9/00

Abstract:
In an exposure apparatus, exposure light from a lamp (continuous light source) (9) is applied at an exposure station (exposure section) (2) to a substrate (4), which is being transferred at a fixed speed in a fixed direction by a substrate transfer section (5), through a mask (11) arranged on an optical axis (optical path) (S) of an exposure optical system (3). At the time of exposing an image of an opening section (11a) of the mask (11) on the substrate (4), the front edge and the side edge (pattern edge) of a pixel (reference pattern) (18) previously formed on the substrate (4) are photographed by a linear CCD (20) of an imaging section (6), and a reference position in the transfer direction and a direction vertical to such direction on the substrate (4) is detected. When the pixel (18) imaged by the imaging section (6) is shifted to an exposure position (E) form an imaging position (F), the exposure station (2) continuously exposes an exposure region along the transfer direction of the substrate (4) while adjusting the position of the mask (11) so that the position of the mask (11) matches with the reference position on the substrate (4).
Public/Granted literature
- US20100128239A1 EXPOSURE METHOD AND EXPOSURE APPARATUS Public/Granted day:2010-05-27
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