Invention Grant
- Patent Title: Enhanced surface-selective spectroscopy using broad-band heterodyne-detected sum frequency generation
- Patent Title (中): 使用宽带外差检测和频率生成的增强的表面选择光谱
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Application No.: US12452192Application Date: 2008-06-18
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Publication No.: US08451442B2Publication Date: 2013-05-28
- Inventor: Alexander V. Benderskii , Igor V. Stiopkin , Himali Dilrukshi Jayathilake
- Applicant: Alexander V. Benderskii , Igor V. Stiopkin , Himali Dilrukshi Jayathilake
- Applicant Address: US MI Detroit
- Assignee: Wayne State University
- Current Assignee: Wayne State University
- Current Assignee Address: US MI Detroit
- Agency: Rohm & Monsanto, PLC
- International Application: PCT/US2008/007579 WO 20080618
- International Announcement: WO2008/156776 WO 20081224
- Main IPC: G01J3/28
- IPC: G01J3/28

Abstract:
Method and apparatus for performing spectroscopy, include the combining of first and second light beams to form a reference beam, focusing the first and second light beams and the reference beam onto a sample, receiving a reflected light beam from the sample at a monochromator, and viewing a predetermined wavelength band of the reflected light beam from the monochromator. Portions of the first and second light beams, which may be visible and IR forms of electromagnetic energy, are heterodyned through a crystal. A monochromator receives a reflection of the reference beam from the sample, and Fourier transformation is performed on the output of the monochromator. The first and second beams of electromagnetic energy can be split to form first and second component beams and the reference beam, all of which are propagated to the sample.
Public/Granted literature
- US20100265501A1 ENHANCED SURFACE-SELECTIVE SPECTROSCOPY USING BROAD-BAND HETERODYNE-DETECTED SUM FREQUENCY GENERATION Public/Granted day:2010-10-21
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