Invention Grant
- Patent Title: Text analysis devices, articles of manufacture, and text analysis methods
- Patent Title (中): 文本分析设备,制品和文本分析方法
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Application No.: US11522178Application Date: 2006-09-15
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Publication No.: US08452767B2Publication Date: 2013-05-28
- Inventor: Alan E. Turner , Elizabeth G. Hetzler , Grant C. Nakamura
- Applicant: Alan E. Turner , Elizabeth G. Hetzler , Grant C. Nakamura
- Applicant Address: US WA Richland
- Assignee: Battelle Memorial Institute
- Current Assignee: Battelle Memorial Institute
- Current Assignee Address: US WA Richland
- Agency: Wells St. John P.S.
- Main IPC: G06F7/00
- IPC: G06F7/00 ; G06F17/30

Abstract:
Text analysis devices, articles of manufacture, and text analysis methods are described according to some aspects. In one aspect, a text analysis device includes processing circuitry configured to analyze initial text to generate a measurement basis usable in analysis of subsequent text, wherein the measurement basis comprises a plurality of measurement features from the initial text, a plurality of dimension anchors from the initial text and a plurality of associations of the measurement features with the dimension anchors, and wherein the processing circuitry is configured to access a viewpoint indicative of a perspective of interest of a user with respect to the analysis of the subsequent text, and wherein the processing circuitry is configured to use the viewpoint to generate the measurement basis.
Public/Granted literature
- US20080069448A1 Text analysis devices, articles of manufacture, and text analysis methods Public/Granted day:2008-03-20
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