Invention Grant
- Patent Title: Test planning using attribute value properties
- Patent Title (中): 使用属性值属性进行测试计划
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Application No.: US13285016Application Date: 2011-10-31
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Publication No.: US08452813B2Publication Date: 2013-05-28
- Inventor: Eitan Farchi , Itay Segall , Aviad Zlotnick
- Applicant: Eitan Farchi , Itay Segall , Aviad Zlotnick
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Century IP Group
- Agent F. Jason Far-hadian
- Main IPC: G06F7/00
- IPC: G06F7/00 ; G06F17/30
Abstract:
A method for modeling a test space is provided. The method comprises defining a coverage model including one or more variables, wherein respective values for the variables are assigned, one or more definitions of value properties for said variables with assigned values, and one or more restrictions that limit combination of variable values that are legal for the model, wherein at least one of said restrictions is defined using at least one value property.
Public/Granted literature
- US20130110880A1 TEST PLANNING USING ATTRIBUTE VALUE PROPERTIES Public/Granted day:2013-05-02
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