Invention Grant
- Patent Title: Fast wave front measurement
- Patent Title (中): 快波前测量
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Application No.: US13457075Application Date: 2012-04-26
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Publication No.: US08454164B2Publication Date: 2013-06-04
- Inventor: Claudia Gorschboth , Christof Donitzky
- Applicant: Claudia Gorschboth , Christof Donitzky
- Applicant Address: DE Erlangen
- Assignee: Wavelight Laser Technologie AG
- Current Assignee: Wavelight Laser Technologie AG
- Current Assignee Address: DE Erlangen
- Agency: Haynes and Boone, LLP
- Priority: EP04020783 20040901
- Main IPC: A61B3/10
- IPC: A61B3/10 ; A61B3/00 ; A61B3/14

Abstract:
Device for measuring wave fronts generated by a lens (4) for an eye, with a radiation source (14) for emitting test radiation (12) to be directed at the lens (4) and a sensor device (26) for detecting wave fronts of incident test radiation after interaction with the lens, wherein the sensor device scans the test radiation (20) after interaction with the lens (4) at a scanning frequency which is at least equal in size to the frequency at which changes in wave fronts occur in the test radiation (20) after interaction with the lens (4).
Public/Granted literature
- US20120268716A1 Fast Wave Front Measurement Public/Granted day:2012-10-25
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