Invention Grant
- Patent Title: Thickness measurer for metal sheet and relative measuring method
- Patent Title (中): 金属板厚度测量仪及相关测量方法
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Application No.: US12936278Application Date: 2009-04-01
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Publication No.: US08454234B2Publication Date: 2013-06-04
- Inventor: Lorenzo Ciani
- Applicant: Lorenzo Ciani
- Applicant Address: IT Buttrio
- Assignee: Danieli Automation SpA
- Current Assignee: Danieli Automation SpA
- Current Assignee Address: IT Buttrio
- Agency: Panitch Schwarze Belisario & Nadel LLP
- Priority: ITUD2008A0072 20080404
- International Application: PCT/EP2009/053901 WO 20090401
- International Announcement: WO2009/121916 WO 20091008
- Main IPC: H01J35/10
- IPC: H01J35/10

Abstract:
Thickness measurer for metal elements (11), comprising a source device (20), able to emit a bundle (F) of ionizing radiations, at a predetermined or predeterminable intensity, a receiver device (24), disposed on an opposite side with respect to the metal element (11) and suitable to detect the residual intensity of the bundle (F) of ionizing radiations. The measurer comprises a cooling device, associated with the source device (20). The cooling device comprises a heat pump element (30), to remove heat from the source device (20) so as to keep the source device (20) at a predetermined and controlled temperature. The thickness measurer also comprises detection means (46, 124) for the direct or indirect detection of the intensity, or the variation in intensity, of the bundle (F) emitted by the source device (20). The detection means (46, 124) is associated with the heat pump element (30), in order to keep the emission of the bundle (F) of ionizing radiations stable.
Public/Granted literature
- US20110026672A1 THICKNESS MEASURER FOR METAL SHEET AND RELATIVE MEASURING METHOD Public/Granted day:2011-02-03
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