Invention Grant
US08454749B2 Method and system for sealing a first assembly to a second assembly of a processing system
有权
用于将第一组件密封到处理系统的第二组件的方法和系统
- Patent Title: Method and system for sealing a first assembly to a second assembly of a processing system
- Patent Title (中): 用于将第一组件密封到处理系统的第二组件的方法和系统
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Application No.: US11305036Application Date: 2005-12-19
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Publication No.: US08454749B2Publication Date: 2013-06-04
- Inventor: Yicheng Li
- Applicant: Yicheng Li
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Main IPC: C23C16/06
- IPC: C23C16/06

Abstract:
A method, computer readable medium, and system for vapor deposition on a substrate that maintain a first assembly of the vapor deposition system at a first temperature, maintain a second assembly of the vapor deposition system at a reduced temperature lower than the first temperature, dispose the substrate in a process space of the first assembly that is vacuum isolated from a transfer space in the second assembly, and deposit a material on the substrate. As such, the system includes a first assembly having a process space configured to facilitate material deposition, a second assembly coupled to the first assembly and having a transfer space to facilitate transfer of the substrate into and out of the deposition system, a substrate stage connected to the second assembly and configured to support the substrate, and a sealing assembly configured to separate the process space from the transfer space. The first assembly is configured to be maintained at a first temperature and the second assembly is configured to be maintained at a reduced temperature lower than the first temperature.
Public/Granted literature
- US20070157683A1 Method and system for sealing a first assembly to a second assembly of a processing system Public/Granted day:2007-07-12
Information query
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