Invention Grant
- Patent Title: Sample processing apparatus and sample rack transporting method
- Patent Title (中): 样品处理装置和样品架输送方法
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Application No.: US12883637Application Date: 2010-09-16
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Publication No.: US08455256B2Publication Date: 2013-06-04
- Inventor: Takashi Yamato , Hiroshi Kurono , Hiroki Koike
- Applicant: Takashi Yamato , Hiroshi Kurono , Hiroki Koike
- Applicant Address: JP Hyogo
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Hyogo
- Agency: Sughrue Mion, PLLC
- Priority: JP2009-215900 20090917
- Main IPC: G01N35/04
- IPC: G01N35/04

Abstract:
A sample processing apparatus, including: a sample processing unit for obtaining a sample from a sample container positioned at a sample obtaining position and performing a predetermined process of the sample; a transport unit for transporting a sample rack holding the sample container via the sample obtaining position; and a transport controller for performing a stop process to stop the transport operation of the sample rack by the transport unit when a transport suspension event has occurred during the transport operation of the sample rack, and for controlling the transport unit to restart the transport operation of the sample rack from a stop position at which the sample rack has been stopped by the stop process.
Public/Granted literature
- US20110123397A1 SAMPLE PROCESSING APPARATUS AND SAMPLE RACK TRANSPORTING METHOD Public/Granted day:2011-05-26
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