Invention Grant
- Patent Title: Silicon germanium heterojunction bipolar transistor structure and method
- Patent Title (中): 硅锗异质结双极晶体管结构及方法
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Application No.: US12719212Application Date: 2010-03-08
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Publication No.: US08455322B2Publication Date: 2013-06-04
- Inventor: Oleg Gluschenkov , Rajendran Krishnasamy , Kathryn T. Schonenberg
- Applicant: Oleg Gluschenkov , Rajendran Krishnasamy , Kathryn T. Schonenberg
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Gibb & Riley, LLC
- Agent Anthony J. Canale
- Main IPC: H01L21/8242
- IPC: H01L21/8242

Abstract:
Disclosed is an improved semiconductor structure (e.g., a silicon germanium (SiGe) hetero-junction bipolar transistor) having a narrow essentially interstitial-free SIC pedestal with minimal overlap of the extrinsic base. Also, disclosed is a method of forming the transistor which uses laser annealing, as opposed to rapid thermal annealing, of the SIC pedestal to produce both a narrow SIC pedestal and an essentially interstitial-free collector. Thus, the resulting SiGe HBT transistor can be produced with narrower base and collector space-charge regions than can be achieved with conventional technology.
Public/Granted literature
- US20100159664A1 SILICON GERMANIUM HETEROJUNCTION BIPOLAR TRANSISTOR STRUCTURE AND METHOD Public/Granted day:2010-06-24
Information query
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