Invention Grant
- Patent Title: Atomic layer deposition using metal amidinates
- Patent Title (中): 使用金属脒基的原子层沉积
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Application No.: US12535324Application Date: 2009-08-04
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Publication No.: US08455672B2Publication Date: 2013-06-04
- Inventor: Roy Gerald Gordon , Booyong S. Lim
- Applicant: Roy Gerald Gordon , Booyong S. Lim
- Applicant Address: US MA Cambridge
- Assignee: President and Fellows of Harvard
- Current Assignee: President and Fellows of Harvard
- Current Assignee Address: US MA Cambridge
- Agency: Wilmer Cutler Pickering Hale and Dorr LLP
- Main IPC: C07F15/00
- IPC: C07F15/00 ; C07F1/00 ; C23C16/00 ; C07C211/00

Abstract:
Metal films are deposited with uniform thickness and excellent step coverage. Copper metal films were deposited on heated substrates by the reaction of alternating doses of copper(I) NN′-diispropylacetamidinate vapor and hydrogen gas. Cobalt metal films were deposited on heated substrates b the reaction of alternating doses of cobalt(II) bis(N,N′-diispropylacetamidinate) vapor and hydrogen gas. Nitrides and oxides of these metals can be formed by replacing the hydrogen with ammonia or water vapor, respectively. The films have very uniform thickness and excellent step coverage in narrow holes. Suitable applications include electrical interconnects in microelectronics and magnetoresistant layers in magnetic information storage devices.
Public/Granted literature
- US20090291208A1 ATOMIC LAYER DEPOSITION USING METAL AMIDINATES Public/Granted day:2009-11-26
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