Invention Grant
US08455881B2 Ge quantum dots for dislocation engineering of III-N on silicon
有权
Ge量子点用于硅片上III-N的位错工程
- Patent Title: Ge quantum dots for dislocation engineering of III-N on silicon
- Patent Title (中): Ge量子点用于硅片上III-N的位错工程
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Application No.: US13235544Application Date: 2011-09-19
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Publication No.: US08455881B2Publication Date: 2013-06-04
- Inventor: Erdem Arkun , Andrew Clark
- Applicant: Erdem Arkun , Andrew Clark
- Applicant Address: US CA Palo Alto
- Assignee: Translucent, Inc.
- Current Assignee: Translucent, Inc.
- Current Assignee Address: US CA Palo Alto
- Agency: Parsons & Goltry
- Agent Robert A. Parsons; Michael W. Goltry
- Main IPC: H01L29/15
- IPC: H01L29/15

Abstract:
A virtual substrate structure includes a crystalline silicon substrate with a first layer of III-N grown on the silicon substrate. Ge clusters or quantum dots are grown on the first layer of III-N and a second layer of III-N is grown on the Ge clusters or quantum dots and any portions of the first layer of III-N exposed between the Ge clusters or quantum dots. Additional alternating Ge clusters or quantum dots and layers of III-N are grown on the second layer of III-N forming an upper surface of III-N. Generally, the additional alternating layers of Ge clusters or quantum dots and layers of III-N are continued until dislocations in the III-N adjacent the upper surface are substantially eliminated.
Public/Granted literature
- US20130069039A1 Ge QUANTUM DOTS FOR DISLOCATION ENGINEERING OF III-N ON SILICON Public/Granted day:2013-03-21
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