Invention Grant
- Patent Title: Stressed semiconductor device and method of manufacturing
- Patent Title (中): 强调半导体器件及其制造方法
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Application No.: US13111732Application Date: 2011-05-19
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Publication No.: US08455883B2Publication Date: 2013-06-04
- Inventor: Miao-Cheng Liao , Min Hao Hong , Hsiang Hsiang Ko , Kei-Wei Chen , Ying-Lang Wang
- Applicant: Miao-Cheng Liao , Min Hao Hong , Hsiang Hsiang Ko , Kei-Wei Chen , Ying-Lang Wang
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Haynes and Boone, LLP
- Main IPC: H01L29/15
- IPC: H01L29/15 ; H01L31/052 ; H01L21/331

Abstract:
A semiconductor device and method of manufacturing a semiconductor device is disclosed. The exemplary semiconductor device and method for fabricating the semiconductor device enhance carrier mobility. The method includes providing a substrate and forming a dielectric layer over the substrate. The method further includes forming a first trench within the dielectric layer, wherein the first trench extends through the dielectric layer and epitaxially (epi) growing a first active layer within the first trench and selectively curing with a radiation energy the dielectric layer adjacent to the first active layer.
Public/Granted literature
- US20120292639A1 STRESSED SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING Public/Granted day:2012-11-22
Information query
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