Invention Grant
- Patent Title: Low voltage differential signaling test system and method
- Patent Title (中): 低压差分信号测试系统及方法
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Application No.: US12791880Application Date: 2010-06-02
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Publication No.: US08456154B2Publication Date: 2013-06-04
- Inventor: Jui-Hsiung Ho , Wang-Ding Su
- Applicant: Jui-Hsiung Ho , Wang-Ding Su
- Applicant Address: TW New Taipei
- Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: TW New Taipei
- Agency: Altis Law Group, Inc.
- Priority: TW99100743A 20100112
- Main IPC: G01R13/20
- IPC: G01R13/20 ; G01R13/22 ; G01R13/34 ; G01R29/26 ; G01R25/00
Abstract:
In a low voltage differential-mode signaling (LVDS) test system and method, a positive signal waveform and a negative signal waveform of an LVDS signal pair are obtained. A differential-mode high voltage, a differential-mode low voltage, and a common-mode noise are measured according to the positive signal waveform and the negative signal waveform. The measurement results are output to an output device.
Public/Granted literature
- US20110169480A1 LOW VOLTAGE DIFFERENTIAL SIGNALING TEST SYSTEM AND METHOD Public/Granted day:2011-07-14
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