Invention Grant
- Patent Title: Probe
- Patent Title (中): 探测
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Application No.: US12770990Application Date: 2010-04-30
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Publication No.: US08456156B2Publication Date: 2013-06-04
- Inventor: Xu Gao , Zhi-Jun Zhang , Zheng-He Feng , Steven-Philip Marcher , Zhan Li , Yong Yan
- Applicant: Xu Gao , Zhi-Jun Zhang , Zheng-He Feng , Steven-Philip Marcher , Zhan Li , Yong Yan
- Applicant Address: CN Beijing TW New Taipei
- Assignee: Tsinghua University,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Tsinghua University,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Beijing TW New Taipei
- Agency: Altis Law Group, Inc.
- Priority: CN200910110163 20091030
- Main IPC: G01R1/06
- IPC: G01R1/06
Abstract:
A probe includes a circuit board, an electric field detecting probe, and a magnetic field detecting probe. The electric field detecting probe and the magnetic field detecting probe are located on the circuit board. An anti-jamming distance between the two detecting probes is a multiple of 5 millimeters and is greater than or equal to 10 millimeters.
Public/Granted literature
- US20110101962A1 PROBE Public/Granted day:2011-05-05
Information query
