Invention Grant
US08456174B2 Method for determining at least one first internal parameter of a sensor
有权
用于确定传感器的至少一个第一内部参数的方法
- Patent Title: Method for determining at least one first internal parameter of a sensor
- Patent Title (中): 用于确定传感器的至少一个第一内部参数的方法
-
Application No.: US12996181Application Date: 2009-05-29
-
Publication No.: US08456174B2Publication Date: 2013-06-04
- Inventor: Joerg Eckrich , Ralf Klausen , Timo Dietz , Wolfgang Fritz , Wolfgang Joeckel
- Applicant: Joerg Eckrich , Ralf Klausen , Timo Dietz , Wolfgang Fritz , Wolfgang Joeckel
- Applicant Address: DE
- Assignee: Continental Teves AG & Co. oHG
- Current Assignee: Continental Teves AG & Co. oHG
- Current Assignee Address: DE
- Agency: RatnerPrestia
- Priority: DE102008027221 20080606
- International Application: PCT/EP2009/056649 WO 20090529
- International Announcement: WO2009/147107 WO 20091210
- Main IPC: G01R27/02
- IPC: G01R27/02 ; G01R19/00 ; G01R31/3187

Abstract:
A sensor and method for determining at least one internal parameter for an active sensor in a special mode of operation. The sensor has at least one sensor element, an evaluation circuit, at least two connecting lines, and a changeover module. The sensor is changed over between a normal mode of operation and the special mode of operation by means of the changeover module and is put into the special mode of operation for the purpose of determining the at least one internal parameter. The sensor has an electric offset source which is used in the special mode of operation to at least partially actuate the evaluation circuit on the basis of the supply voltage of the sensor which is applied to the two connecting lines such that the at least one internal parameter of the sensor can be ascertained from the sensor output signal.
Public/Granted literature
- US20110089930A1 METHOD FOR DETERMINING AT LEAST ONE FIRST INTERNAL PARAMETER OF A SENSOR Public/Granted day:2011-04-21
Information query