Invention Grant
- Patent Title: Electronic component contactor, apparatus for testing electronic component, and method for testing electronic component
- Patent Title (中): 电子元件接触器，电子部件检测装置及电子部件检测方法
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Application No.: US13051657Application Date: 2011-03-18
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Publication No.: US08456183B2Publication Date: 2013-06-04
- Inventor: Shigeru Suzuki , Shingo Yanagihara , Keiki Koike
- Applicant: Shigeru Suzuki , Shingo Yanagihara , Keiki Koike
- Applicant Address: JP Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Young & Thompson
- Priority: JP2010-064426 20100319
- Main IPC: G01R31/20
- IPC: G01R31/20
Abstract:
An electronic component contactor includes a plurality of contact pins, a housing that encases and determines positions of the plurality of contact pins, and a buffer member that buffers against the behavior of the contact pins. The contact pins each includes a base portion, a stretch portion that stretches from the base portion in an arc shape, a contact portion that is formed in the stretch portion, and a load receiving portion. The housing includes a support base in which a surface supporting the buffer member is formed to be flat. The buffer member is formed in a sheet-like shape. A portion of the buffer member that faces the load receiving portion is supported by the support base.
Public/Granted literature
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