Invention Grant
US08456185B2 Test adapter and method for achieving optical alignment and thermal coupling thereof with a device under test
有权
用于实现与被测器件的光学对准和热耦合的测试适配器和方法
- Patent Title: Test adapter and method for achieving optical alignment and thermal coupling thereof with a device under test
- Patent Title (中): 用于实现与被测器件的光学对准和热耦合的测试适配器和方法
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Application No.: US12858424Application Date: 2010-08-17
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Publication No.: US08456185B2Publication Date: 2013-06-04
- Inventor: Frank Yashar , David J. K. Meadowcroft , Seng-Kum Chan
- Applicant: Frank Yashar , David J. K. Meadowcroft , Seng-Kum Chan
- Applicant Address: SG Singapore
- Assignee: Avago Technologies General IP (Singapore) Pte. Ltd.
- Current Assignee: Avago Technologies General IP (Singapore) Pte. Ltd.
- Current Assignee Address: SG Singapore
- Main IPC: G01R31/20
- IPC: G01R31/20

Abstract:
Independent assemblies are compliantly mounted to a force transfer mechanism to optically align and thermally couple a device under test (DUT) to a test apparatus. A first assembly includes an optical connector. The first assembly has an alignment feature and a first compliant interface. A second assembly includes a thermal control member and force transfer members coupled to a structure. A passage permits a portion of the arm of the first assembly to extend through the structure. The force transfer members provide respective seats for an additional compliant interface. The alignment feature engages a corresponding feature to align the optical connector with the DUT before the compliant interfaces compress under an external force. Compliant mounting of the assemblies accommodates manufacturing tolerances in the DUT so that contact forces on the DUT are relatively consistent and thereby enable consistent optical and thermal coupling between the test apparatus and the DUT.
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