Invention Grant
- Patent Title: 3D reconstruction from oversampled 2D projections
- Patent Title (中): 过度采样2D投影的3D重建
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Application No.: US12634863Application Date: 2009-12-10
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Publication No.: US08456469B2Publication Date: 2013-06-04
- Inventor: Satpal Singh
- Applicant: Satpal Singh
- Main IPC: G06T17/00
- IPC: G06T17/00

Abstract:
A method is presented for generating a 3D image of an object using x-rays. The invention describes a method of generating an image of a slice through the object using a large number of detector elements as employed in commonly used x-ray scanners. The method described is a two step process, in the first step, Algebraic methods are used to solve a set of simultaneous linear equations to solve for the densities of the pixels representing the slice. The dimension of these pixels defining the slice is large in comparison to the size of detector elements, therefore a second step of backprojection is used to generated a slice image of higher resolution. The use of a second or a third source further allows the generation of higher resolution images.
Public/Granted literature
- US20110141111A1 3D RECONSTRUCTION FROM OVERSAMPLED 2D PROJECTIONS Public/Granted day:2011-06-16
Information query
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06T | 一般的图像数据处理或产生 |
G06T17/00 | 用于计算机制图的3D建模 |