Invention Grant
US08456613B2 Method and apparatus for quantification of illumination non-uniformity in the mask plane of a lithographic exposure system 有权
用于定量光刻曝光系统的掩模平面中的照明不均匀性的方法和装置

Method and apparatus for quantification of illumination non-uniformity in the mask plane of a lithographic exposure system
Abstract:
This disclosure relates to lithography using pulsed laser illumination. In particular it relates to lithography for producing electronic devices on wafers using multi-mode excimer and molecular lasers, e.g. KrF, ArF, and F2 lasers. It may also apply to illumination systems where several single-mode sources are mixed or one single-mode laser beam is split and recombined with time delays, thereby creating an equivalent multimode source and to EUV lithography. Particular aspects of the present invention are described in the claims, specification and drawings.
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