Invention Grant
- Patent Title: Multiple measuring point configuration for a chromatic point sensor
- Patent Title (中): 彩色点传感器的多个测量点配置
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Application No.: US12869687Application Date: 2010-08-26
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Publication No.: US08456637B2Publication Date: 2013-06-04
- Inventor: Casey Edward Emtman , Yong Xie
- Applicant: Casey Edward Emtman , Yong Xie
- Applicant Address: JP Kawasaki-shi
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: JP Kawasaki-shi
- Agency: Christensen O'Connor Johnson Kindness PLLC
- Main IPC: G01N21/55
- IPC: G01N21/55

Abstract:
A dual beam assembly is provided for attachment to a chromatic confocal point sensor optical pen. The optical pen provides a single source beam having a measurement range R in the absence of the dual beam assembly. The dual beam assembly includes a first reflective element that is positioned in the source beam and divides it into a first measurement beam and a second measurement beam. The dual beam assembly outputs the first and second measurement beams along first and second measurement axes to different workpiece regions and returns workpiece measurement light arising from the first and second measurement beams back to the optical pen. A second reflective element may be included and configured to deflect the second measurement beam along a desired direction. An offset may be provided between the measuring ranges of the first and second measurement beams.
Public/Granted literature
- US20120050722A1 MULTIPLE MEASURING POINT CONFIGURATION FOR A CHROMATIC POINT SENSOR Public/Granted day:2012-03-01
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