Invention Grant
US08456640B2 Apparatus and method for measuring reflectance of optical laser components
有权
用于测量光学激光器部件的反射率的装置和方法
- Patent Title: Apparatus and method for measuring reflectance of optical laser components
- Patent Title (中): 用于测量光学激光器部件的反射率的装置和方法
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Application No.: US13231711Application Date: 2011-09-13
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Publication No.: US08456640B2Publication Date: 2013-06-04
- Inventor: Bincheng Li , Zhechao Qu , Yanling Han
- Applicant: Bincheng Li , Zhechao Qu , Yanling Han
- Applicant Address: CN Beijing
- Assignee: Institute of Microelectronics, Chinese Academy of Sciences
- Current Assignee: Institute of Microelectronics, Chinese Academy of Sciences
- Current Assignee Address: CN Beijing
- Agency: China Science Law Group
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/55

Abstract:
Apparatus and methods for measuring reflectance of optical laser components are disclosed. In one embodiment, when the reflectance of the test optical laser component is higher than 98%, a cavity ring-down (CRD) technique based configuration is employed to measure the reflectance of the test optical laser component. On the other hand, when the reflectance of the test optical laser component is lower than 98% or there is no measurable CRD signal, by removing the output cavity mirror in the CRD apparatus, a photometric configuration is formed to measure the reflectance. The switching between the two techniques can be achieved by removing or inserting the output cavity mirror of the ring-down cavity in the CRD apparatus.
Public/Granted literature
- US20120154815A1 APPARATUS AND METHOD FOR MEASURING REFLECTANCE OF OPTICAL LASER COMPONENTS Public/Granted day:2012-06-21
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