Invention Grant
- Patent Title: Systems and methods for detecting a reference pattern
- Patent Title (中): 用于检测参考图案的系统和方法
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Application No.: US12651280Application Date: 2009-12-31
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Publication No.: US08456775B2Publication Date: 2013-06-04
- Inventor: Jeffery Grundvig , Viswanath Annampedu , Jason Byrne , Keith Bloss
- Applicant: Jeffery Grundvig , Viswanath Annampedu , Jason Byrne , Keith Bloss
- Applicant Address: US CA San Jose
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA San Jose
- Agency: Hamilton DeSanctis and Cha
- Main IPC: G11B5/09
- IPC: G11B5/09
Abstract:
Various embodiments of the present invention provide systems and methods for locating a reference pattern on a storage medium. For example, various embodiments of the present invention provide systems for locating a reference pattern on a storage medium. Such systems include a sliding window phase calculator circuit, a delay circuit and a mark detector circuit.
Public/Granted literature
- US20110157737A1 Systems and Methods for Detecting a Reference Pattern Public/Granted day:2011-06-30
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