Invention Grant
- Patent Title: Reliable set operation for phase-change memory cell
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Application No.: US12623299Application Date: 2009-11-20
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Publication No.: US08456886B2Publication Date: 2013-06-04
- Inventor: Ferdinando Bedeschi
- Applicant: Ferdinando Bedeschi
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Knobbe, Martens, Olson & Bear LLP
- Priority: WOPCT/IT2008/000823 20081231
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A Phase-Change Memory (PCM) device and a method of writing data to the PCM device are described. The PCM device includes a multi-phase data storage cell having at least a Set state and a Reset state that may be established using a heater configured to heat the data storage cell. A memory interface may be coupled with the heater configured to write data to the data storage cell, the data being represented by the Set or the Reset states. A write Reset pulse is used to place the data storage cell in the Reset state corresponding to a read value that is less than a read threshold. A write Set pulse that is a predetermined function of the write Reset pulse is used to place the data storage cell in the Set state. The PCM device may include additional intermediate states that enable each data storage cell to store two or more bits of information. Other embodiments may be described and claimed.
Public/Granted literature
- US20100165725A1 RELIABLE SET OPERATION FOR PHASE-CHANGE MEMORY CELL Public/Granted day:2010-07-01
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