Invention Grant
US08456910B2 Nonvolatile memory cell with well extending under transistor and data storage capacitor of memory cell
有权
非易失性存储单元在存储器单元的晶体管和数据存储电容器下具有良好的扩展
- Patent Title: Nonvolatile memory cell with well extending under transistor and data storage capacitor of memory cell
- Patent Title (中): 非易失性存储单元在存储器单元的晶体管和数据存储电容器下具有良好的扩展
-
Application No.: US12846996Application Date: 2010-07-30
-
Publication No.: US08456910B2Publication Date: 2013-06-04
- Inventor: Dzianis Lukashevich
- Applicant: Dzianis Lukashevich
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Eschweiler & Associates, LLC
- Main IPC: G11C14/00
- IPC: G11C14/00

Abstract:
One embodiment relates to a memory device. The memory device includes a capacitor having a first capacitor plate and a second capacitor plate, wherein the first and second capacitor plates are separated by an insulating layer and are formed over a first portion of a semiconductor substrate. The memory device also includes a transistor having a source region, a drain region, and a gate region, where the gate region is coupled to the second capacitor plate. The transistor is formed over a second portion of the semiconductor substrate. A well region is disposed in the first and second portions of the semiconductor substrate and has a doping-type that is opposite a doping-type of the semiconductor substrate. Other embodiments are also disclosed.
Public/Granted literature
- US20120026793A1 Nonvolatile Memory Cell With Extended Well Public/Granted day:2012-02-02
Information query