Invention Grant
US08456916B2 Non-volatile memory unit cell with improved sensing margin and reliability
有权
非易失性存储单元,具有改进的感测裕度和可靠性
- Patent Title: Non-volatile memory unit cell with improved sensing margin and reliability
- Patent Title (中): 非易失性存储单元,具有改进的感测裕度和可靠性
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Application No.: US13541755Application Date: 2012-07-04
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Publication No.: US08456916B2Publication Date: 2013-06-04
- Inventor: Hsin-Ming Chen , Shih-Chen Wang , Wen-Hao Ching , Yen-Hsin Lai , Hau-Yan Lu , Ching-Sung Yang
- Applicant: Hsin-Ming Chen , Shih-Chen Wang , Wen-Hao Ching , Yen-Hsin Lai , Hau-Yan Lu , Ching-Sung Yang
- Applicant Address: TW Hsinchu
- Assignee: eMemory Technology Inc.
- Current Assignee: eMemory Technology Inc.
- Current Assignee Address: TW Hsinchu
- Agency: Jianq Chyun IP Office
- Main IPC: G11C11/34
- IPC: G11C11/34

Abstract:
An only-one-polysilicon layer non-volatile memory unit cell includes a first P-type transistor, a second P-type transistor, a N-type transistor pair, a first and second coupling capacitors is provided. The N-type transistor pair has a third transistor and a fourth transistor that are connected. The third transistor and the fourth transistor have a first floating polysilicon gate and a second floating polysilicon gate to serve as charge storage mediums, respectively. One end of the second coupling capacitor is connected to the gate of the second transistor and is coupled to the second floating polysilicon gate, the other end of the second coupling capacitor receives a second control voltage. One end of the second coupling capacitor is connected to the gate of the second transistor and is coupled to the second floating polysilicon gate, the other end of the second coupling capacitor receives a second control voltage.
Public/Granted literature
- US20120273860A1 NON-VOLATILE MEMORY UNIT CELL WITH IMPROVED SENSING MARGIN AND RELIABILITY Public/Granted day:2012-11-01
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