Invention Grant
US08457276B2 Non-destructive detection method for detecting state of solder ball
失效
用于检测焊球状态的非破坏性检测方法
- Patent Title: Non-destructive detection method for detecting state of solder ball
- Patent Title (中): 用于检测焊球状态的非破坏性检测方法
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Application No.: US12939101Application Date: 2010-11-03
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Publication No.: US08457276B2Publication Date: 2013-06-04
- Inventor: Wei-Chiang Lee
- Applicant: Wei-Chiang Lee
- Applicant Address: TW New Taipei
- Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: TW New Taipei
- Agency: Altis Law Group, Inc.
- Priority: TW99101999A 20100126
- Main IPC: G01B15/08
- IPC: G01B15/08 ; G01N23/18

Abstract:
A detection method detects cracks with small thickness and solder voids with small volume in a solder ball. The method immerses a washed solder ball into a high absorption material solution for a first predetermined time period. The immersed solder ball is then dried in a vacuum chamber at a fixed temperature for a second predetermined time period. Materials of the high absorption material solution of the solder ball are removed by a low absorption material solution. An X-ray machine then detects the cracks and the solder voids in the solder ball.
Public/Granted literature
- US20110182405A1 NON-DESTRUCTIVE DETECTION METHOD FOR DETECTING STATE OF SOLDER BALL Public/Granted day:2011-07-28
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