Invention Grant
US08457390B1 Method and apparatus for training a probe model based machine vision system
有权
用于训练基于探针模型的机器视觉系统的方法和装置
- Patent Title: Method and apparatus for training a probe model based machine vision system
- Patent Title (中): 用于训练基于探针模型的机器视觉系统的方法和装置
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Application No.: US12249318Application Date: 2008-10-10
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Publication No.: US08457390B1Publication Date: 2013-06-04
- Inventor: Simon Barker , Adam Wagman , Aaron Wallack , David J. Michael
- Applicant: Simon Barker , Adam Wagman , Aaron Wallack , David J. Michael
- Applicant Address: US MA Natick
- Assignee: Cognex Corporation
- Current Assignee: Cognex Corporation
- Current Assignee Address: US MA Natick
- Agency: Quarles & Brady LLP
- Main IPC: G06K9/62
- IPC: G06K9/62

Abstract:
A method for training a pattern recognition algorithm for a machine vision system that uses models of a pattern to be located, the method comprising the steps of training each of a plurality of models using a different training image wherein each of the training images is a version of a single image of the pattern at a unique coarse image resolution, using the models to identify at least one robust image resolution where the image resolution is suitable for locating the pattern within an accuracy limit of the actual location of the pattern in the image and storing the at least one robust image resolution for use in subsequent pattern recognition processes.
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