Invention Grant
- Patent Title: Detection of textural defects using a one class support vector machine
- Patent Title (中): 使用一类支持向量机检测纹理缺陷
-
Application No.: US12632389Application Date: 2009-12-07
-
Publication No.: US08457414B2Publication Date: 2013-06-04
- Inventor: Sina Jahanbin , Alan C. Bovik , Eduardo Perez , Dinesh Nair
- Applicant: Sina Jahanbin , Alan C. Bovik , Eduardo Perez , Dinesh Nair
- Applicant Address: US TX Austin US TX Austin
- Assignee: National Instruments Corporation,Board of Regents of the University of Texas System
- Current Assignee: National Instruments Corporation,Board of Regents of the University of Texas System
- Current Assignee Address: US TX Austin US TX Austin
- Agency: Meyertons Hood Kivlin Kowert & Goetzel, P.C.
- Agent Jeffrey C. Hood
- Main IPC: G06T9/62
- IPC: G06T9/62

Abstract:
Method for detecting textural defects in an image. The image, which may have an irregular visual texture, may be received. The image may be decomposed into a plurality of subbands. The image may be portioned into a plurality of partitions. A plurality of grey-level co-occurrence matrices (GLCMs) may be determined for each partition. A plurality of second-order statistical attributes may be extracted for each GLCM. A feature vector may be constructed for each partition, where the feature vector includes the second order statistical attributes for each GLCM for the partition. Each partition may be classified based on the feature vector for the respective partition. Classification of the partitions may utilize a one-class support vector machine, and may determine if a defect is present in the image.
Public/Granted literature
- US20110026804A1 Detection of Textural Defects Using a One Class Support Vector Machine Public/Granted day:2011-02-03
Information query