Invention Grant
- Patent Title: System and method for determining accuracy of an infrared thermometer measurement
- Patent Title (中): 用于确定红外测温仪测量精度的系统和方法
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Application No.: US12749373Application Date: 2010-03-29
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Publication No.: US08457922B2Publication Date: 2013-06-04
- Inventor: Ken Pomper , Medwin Schreher , Matt Rekow
- Applicant: Ken Pomper , Medwin Schreher , Matt Rekow
- Applicant Address: US WA Everett
- Assignee: Fluke Corporation
- Current Assignee: Fluke Corporation
- Current Assignee Address: US WA Everett
- Agency: Perkins Coie LLP
- Main IPC: G01K11/00
- IPC: G01K11/00 ; G06F11/30

Abstract:
A system and method for determining whether a temperature measurement made with an infrared thermometer is accurate is disclosed. An infrared sensor array is used to detect infrared radiation from a target object. By analyzing the relative values of output signals from the individual sensor elements, a determination can be made whether radiation from the target object sufficiently fills the field of view of the detecting element of the instrument. A temperature measurement is considered accurate if this criteria is met.
Public/Granted literature
- US20100292952A1 SYSTEM AND METHOD FOR DETERMINING ACCURACY OF AN INFRARED THERMOMETER MEASUREMENT Public/Granted day:2010-11-18
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