Invention Grant
US08457926B2 Disk protrusion detection/flatness measurement circuit and disk glide tester
有权
磁盘突出检测/平坦度测量电路和磁盘滑移测试仪
- Patent Title: Disk protrusion detection/flatness measurement circuit and disk glide tester
- Patent Title (中): 磁盘突出检测/平坦度测量电路和磁盘滑移测试仪
-
Application No.: US12841599Application Date: 2010-07-22
-
Publication No.: US08457926B2Publication Date: 2013-06-04
- Inventor: Kenichi Shitara , Yasuhiro Tokumaru
- Applicant: Kenichi Shitara , Yasuhiro Tokumaru
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Brundidge & Stanger, P.C.
- Priority: JP2009-199592 20090831
- Main IPC: G01B5/20
- IPC: G01B5/20 ; G01B21/20 ; G06F19/00 ; G06F17/40

Abstract:
The present invention relates to a disk protrusion detection/flatness measurement circuit and a disk glide tester, in which protrusion detection and average value calculation can be performed without switching signal processing circuits of two systems, one for the protrusion detection of a disk and the other for the average value calculation with respect to a track or a sector of the disk. This also makes it possible to reduce the size of the measurement circuit. In the protrusion detection/flatness measurement circuit, a signal from a protrusion detection sensor is amplified and converted from an analog signal to a digital signal. The signal passes through a band-pass filter to obtain a digital signal with a predetermined bandwidth. Then, peak detection and average value calculation processes are applied in parallel to the obtained digital signal. Thus, pass/fail decision of the disk can be made based on the detected peak and average values.
Public/Granted literature
- US20110051580A1 DISK PROTRUSION DETECTION/FLATNESS MEASUREMENT CIRCUIT AND DISK GLIDE TESTER Public/Granted day:2011-03-03
Information query