Invention Grant
- Patent Title: Adapter and scan test logic synchronizing from idle state
- Patent Title (中): 适配器和扫描测试逻辑从空闲状态同步
-
Application No.: US13489641Application Date: 2012-06-06
-
Publication No.: US08458505B2Publication Date: 2013-06-04
- Inventor: Gary L. Swoboda
- Applicant: Gary L. Swoboda
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Lawrence J. Bassuk; W. James Brady; Ferederick J. Telecky, Jr.
- Main IPC: G06F1/04
- IPC: G06F1/04
Abstract:
A method comprises a system comprising a host device coupled to a first remote device actively operating according to a state diagram that the host device and all remote devices follow during operation of the system. The method further comprises powering up a second remote device while the host device and first remote device are actively operating according to the state diagram. The second remote device waits for a synchronization point sequence. Upon detecting the synchronization point sequence, the second remote device implements a predetermined feature set and synchronizes itself to the state diagram at a common point as the host device and first remote device.
Public/Granted literature
- US20120254681A1 SYNCHRONIZING A DEVICE THAT HAS BEEN POWER CYCLED TO AN ALREADY OPERATIONAL SYSTEM Public/Granted day:2012-10-04
Information query
