Invention Grant
- Patent Title: Bayesian approach to identifying sub-module failure
- Patent Title (中): 贝叶斯方法识别子模块故障
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Application No.: US12727437Application Date: 2010-03-19
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Publication No.: US08458525B2Publication Date: 2013-06-04
- Inventor: Andrew Pargellis , Brian M. Sutin
- Applicant: Andrew Pargellis , Brian M. Sutin
- Applicant Address: US CT Windsor Locks
- Assignee: Hamilton Sundstrand Space Systems International, Inc.
- Current Assignee: Hamilton Sundstrand Space Systems International, Inc.
- Current Assignee Address: US CT Windsor Locks
- Agency: Kinney & Lange, P.A.
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A diagnostic device identifies failed sub-modules within a larger system based on error codes received from the system. The device stores a likelihood matrix that correlates each sub-module with each possible error code and maintains a likelihood value corresponding to the probability of a failed sub-module generating a corresponding error code and stores a prior probability of failure associated with each sub-module based on prior observational data. In response to received error codes, the device calculates a posterior probability of failure for each of the plurality of sub-modules based on a product of the likelihood values corresponding to the received error codes and the prior probability of failure associated with each sub-module. Based on the calculated posterior probability, the device identifies the sub-module with the highest posterior probability of failure as the failed sub-module.
Public/Granted literature
- US20110231703A1 BAYESIAN APPROACH TO IDENTIFYING SUB-MODULE FAILURE Public/Granted day:2011-09-22
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