Invention Grant
- Patent Title: Data storage device tester
- Patent Title (中): 数据存储设备测试仪
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Application No.: US12749309Application Date: 2010-03-29
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Publication No.: US08458526B2Publication Date: 2013-06-04
- Inventor: Lawrence J. Dalphy , Curtis E. Stevens , Daniel K. Blackburn
- Applicant: Lawrence J. Dalphy , Curtis E. Stevens , Daniel K. Blackburn
- Applicant Address: US CA Irvine
- Assignee: Western Digital Technologies, Inc.
- Current Assignee: Western Digital Technologies, Inc.
- Current Assignee Address: US CA Irvine
- Main IPC: G06F11/273
- IPC: G06F11/273
Abstract:
A data storage device (DSD) tester for testing a DSD is disclosed. The DSD tester comprises control circuitry operable to receive a DSD log from the DSD, wherein the DSD log comprises at least one entry identifying at least one error condition. A sequence of commands associated with the error condition is executed in order to determine whether the DSD is defective.
Public/Granted literature
- US20110154113A1 DATA STORAGE DEVICE TESTER Public/Granted day:2011-06-23
Information query
