Invention Grant
- Patent Title: Integrated circuit and diagnosis circuit
- Patent Title (中): 集成电路和诊断电路
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Application No.: US12974155Application Date: 2010-12-21
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Publication No.: US08458540B2Publication Date: 2013-06-04
- Inventor: Ryoichi Inagawa
- Applicant: Ryoichi Inagawa
- Applicant Address: JP Yokohama
- Assignee: Fujitsu Semiconductor Limited
- Current Assignee: Fujitsu Semiconductor Limited
- Current Assignee Address: JP Yokohama
- Agency: Fujitsu Patent Center
- Priority: JP2009-293138 20091224
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A integrated circuit include: a first selection circuit selecting first data from input-data or scan-data, scan-data being for performing a diagnosis of a combinational circuit, input-data being received from a combinational circuit; a first latch circuit holding first data as first output-data in accordance with a first signal; a second latch circuit holding first output-data as second output-data in accordance with which of the first signal and a second signal, the second signal being used to force the second latch circuit to hold first output-data; a third latch circuit holding first output-data as third output-data in accordance with which of the first signal and a third signal, the third signal being used to force the third latch circuit to hold first output-data; and a second selection circuit selecting second data from among the data which include second output-data and third output-data.
Public/Granted literature
- US20110161756A1 INTEGRATED CIRCUIT AND DIAGNOSIS CIRCUIT Public/Granted day:2011-06-30
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