Invention Grant
US08458644B2 RF circuit, circuit evaluation method, algorithm and recording medium
失效
RF电路,电路评估方法,算法和记录介质
- Patent Title: RF circuit, circuit evaluation method, algorithm and recording medium
- Patent Title (中): RF电路,电路评估方法,算法和记录介质
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Application No.: US13539637Application Date: 2012-07-02
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Publication No.: US08458644B2Publication Date: 2013-06-04
- Inventor: Takashi Inoue
- Applicant: Takashi Inoue
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: McGinn IP Law Group, PLLC
- Priority: JP2006-314700 20061121
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
An RF circuit on a circuit simulator to be used in a microwave or millimeter wave range or a high-frequency range includes a function for being inserted by a first port and a second port thereof in a circuit to be observed, at an arbitrary cross-sectional point of the circuit, and evaluating a reflection coefficient (or a characteristic impedance) in the cross-section. The insertion loss between the first port and the second port is zero or approximately zero and is ignorable also for any finite system impedance other than zero.
Public/Granted literature
- US20120278785A1 RF CIRCUIT, CIRCUIT EVALUATION METHOD, ALGORITHM AND RECORDING MEDIUM Public/Granted day:2012-11-01
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