Invention Grant
- Patent Title: System and method of detecting implant detachment
- Patent Title (中): 检测植入物脱离的系统和方法
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Application No.: US13488225Application Date: 2012-06-04
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Publication No.: US08460332B2Publication Date: 2013-06-11
- Inventor: Tai D. Tieu , George Martinez
- Applicant: Tai D. Tieu , George Martinez
- Applicant Address: US CA Tustin
- Assignee: MicroVention, Inc.
- Current Assignee: MicroVention, Inc.
- Current Assignee Address: US CA Tustin
- Agency: Inskeep IP Group, Inc.
- Main IPC: A61M29/00
- IPC: A61M29/00

Abstract:
A system and method of detecting implant detachment within the body of a patient. The activation of the heater coil causes the degradation, melting or reduction of a component that brings the heater coil into or out of electrical contact with another component, or causes the individual loops of the coil to contact each other, thereby resulting in a notable change in resistance in the circuit supplying the heater coil with electricity.
Public/Granted literature
- US20120245621A1 System And Method Of Detecting Implant Detachment Public/Granted day:2012-09-27
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