Invention Grant
- Patent Title: Analysis instrument
- Patent Title (中): 分析仪器
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Application No.: US10537708Application Date: 2003-12-01
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Publication No.: US08460523B2Publication Date: 2013-06-11
- Inventor: Yasunori Shiraki , Yasuhide Kusaka , Taizo Kobayashi
- Applicant: Yasunori Shiraki , Yasuhide Kusaka , Taizo Kobayashi
- Applicant Address: JP Kyoto-Shi
- Assignee: Arkray, Inc.
- Current Assignee: Arkray, Inc.
- Current Assignee Address: JP Kyoto-Shi
- Agency: Fox Rothschild LLP
- Priority: JP2002-350198 20021202
- International Application: PCT/JP03/15358 WO 20031201
- International Announcement: WO2004/051249 WO 20040617
- Main IPC: G01N33/487
- IPC: G01N33/487

Abstract:
The present invention relates to an analytical tool (X1) to be mounted to an analytical apparatus (1) which includes a plurality of terminals (11, 12) and an analysis circuit (13). The analytical tool includes a plurality of electrodes (21, 22) coming into contact with the plurality of terminals (11, 12) when mounted to the analytical apparatus (1). In the analytical tool (X1), at least one (12) of the electrodes (21, 22) serves as a disturbing-noise countermeasure electrode to which disturbing noise is more likely to come in comparison with the other electrodes (11) than the above-mentioned electrode (12).
Public/Granted literature
- US20060042943A1 Analysis instrument Public/Granted day:2006-03-02
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