Invention Grant
US08461518B2 Method of collecting calibration data in radiation tomography apparatus
失效
辐射断层摄影仪中收集校准数据的方法
- Patent Title: Method of collecting calibration data in radiation tomography apparatus
- Patent Title (中): 辐射断层摄影仪中收集校准数据的方法
-
Application No.: US13145786Application Date: 2009-01-23
-
Publication No.: US08461518B2Publication Date: 2013-06-11
- Inventor: Tetsuro Mizuta , Yoshihiro Inoue , Masaharu Amano , Kazumi Tanaka , Atsushi Ohtani
- Applicant: Tetsuro Mizuta , Yoshihiro Inoue , Masaharu Amano , Kazumi Tanaka , Atsushi Ohtani
- Applicant Address: JP Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto
- Agency: Cheng Law Group, PLLC
- International Application: PCT/JP2009/000251 WO 20090123
- International Announcement: WO2010/084528 WO 20100729
- Main IPC: G01D18/00
- IPC: G01D18/00

Abstract:
This invention has one object to provide a method of collecting calibration data in radiation tomography apparatus that allows reliable collection of calibration data with a wide detector ring. In order to achieve this purpose, in the method of collecting calibration data in radiation tomography apparatus according to this invention, the number of coincidence events is obtained while the phantom that emits annihilation gamma-ray pairs moves as to pass through an inner hole of the detector ring. Such configuration dose not need the phantom having a width equal or larger than the detector ring, and may realize reliable collection of calibration data. Moreover, it may be considered that annihilation gamma-ray pairs have been emitted in uniform property without depending on positions of the detector ring. As a result, calibration data that is more suitable for removal of a image artifact may be obtained.
Public/Granted literature
- US20110278443A1 METHOD OF COLLECTING CALIBRATION DATA IN RADIATION TOMOGRAPHY APPARATUS Public/Granted day:2011-11-17
Information query