Invention Grant
- Patent Title: Method of characterizing a polycrystalline diamond element by at least one magnetic measurement
- Patent Title (中): 通过至少一个磁测量来表征多晶金刚石元件的方法
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Application No.: US12785014Application Date: 2010-05-21
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Publication No.: US08461832B2Publication Date: 2013-06-11
- Inventor: Kenneth E. Bertagnolli , Debkumar Mukhopadhyay
- Applicant: Kenneth E. Bertagnolli , Debkumar Mukhopadhyay
- Applicant Address: US UT Orem
- Assignee: US Synthetic Corporation
- Current Assignee: US Synthetic Corporation
- Current Assignee Address: US UT Orem
- Agency: Workman Nydegger
- Main IPC: G01N27/72
- IPC: G01N27/72 ; B32B9/00
Abstract:
In an embodiment, a method of characterizing a polycrystalline diamond element is disclosed. The method includes providing the polycrystalline diamond element, and measuring at least one magnetic characteristic of the polycrystalline diamond element.
Public/Granted literature
- US20100225311A1 METHOD OF CHARACTERIZING A POLYCRYSTALLINE DIAMOND ELEMENT BY AT LEAST ONE MAGNETIC MEASUREMENT Public/Granted day:2010-09-09
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