Invention Grant
- Patent Title: Semiconductor device and interface board for testing the same
- Patent Title (中): 半导体器件和接口板进行测试相同
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Application No.: US12495143Application Date: 2009-06-30
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Publication No.: US08461859B2Publication Date: 2013-06-11
- Inventor: Khil-Ohk Kang
- Applicant: Khil-Ohk Kang
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2009-0026914 20090330
- Main IPC: G01R31/26
- IPC: G01R31/26
Abstract:
A semiconductor device includes a common probing pad; an internal voltage generation unit having a plurality of internal voltage generation blocks configured to generate a plurality of internal voltages; and a probing voltage selection unit configured to transfer an internal voltage selected from the internal voltages to the common probing pad in response to a plurality of voltage selection signals.
Public/Granted literature
- US20100244854A1 SEMICONDUCTOR DEVICE AND INTERFACE BOARD FOR TESTING THE SAME Public/Granted day:2010-09-30
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