Invention Grant
- Patent Title: Systems and methods to determine kinematical parameters using RFID tags
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Application No.: US12134107Application Date: 2008-06-05
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Publication No.: US08461966B2Publication Date: 2013-06-11
- Inventor: John R. Tuttle
- Applicant: John R. Tuttle
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Greenberg Traurig, LLP
- Main IPC: H04Q5/22
- IPC: H04Q5/22

Abstract:
Systems and methods to determine kinematical parameters of physical objects using radio frequency identification (RFID) tags attached to the objects. In one embodiment, one of a population of RFID tags is selectively instructed by an RFID reader to backscatter the interrogating electromagnetic wave and thus allow the RFID reader to measure the position, speed, acceleration, jerk of the object to which the tag is attached. The RFID reader combines the signal representing the backscattered interrogating electromagnetic wave and the signal representing the interrogating electromagnetic wave transmitted by the RFID reader to determine or monitor one or more of the kinematical parameters of the object.
Public/Granted literature
- US20090303005A1 Systems and Methods to Determine Kinematical Parameters using RFID Tags Public/Granted day:2009-12-10
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