Invention Grant
- Patent Title: Lithographic apparatus and device manufacturing method
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Application No.: US12222123Application Date: 2008-08-01
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Publication No.: US08462314B2Publication Date: 2013-06-11
- Inventor: Marcel Beckers , Marcus Adrianus Van De Kerkhof , Siebe Landheer , Wouterus Johannes Petrus Maria Maas , Jeroen Peter Johannes Bruijstens , Ivo Adam Johannes Thomas , Franciscus Johannes Joseph Janssen , Bartholomeus Mathias Van Oerle
- Applicant: Marcel Beckers , Marcus Adrianus Van De Kerkhof , Siebe Landheer , Wouterus Johannes Petrus Maria Maas , Jeroen Peter Johannes Bruijstens , Ivo Adam Johannes Thomas , Franciscus Johannes Joseph Janssen , Bartholomeus Mathias Van Oerle
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- Main IPC: G03B27/52
- IPC: G03B27/52 ; G03B27/42 ; G03F7/20

Abstract:
A lithographic apparatus includes a projection system configured to project a patterned radiation beam onto a target portion of a substrate. The apparatus also includes a barrier member, surrounding a space between the projection system and, in use, the substrate, to define in part with the projection system a reservoir for liquid. A radially outer surface of the barrier member facing a portion of projection system and a radially outer surface of the portion of the projection system facing the barrier member each have a liquidphobic outer surface. The liquidphobic outer surface of the barrier member and/or the liquidphobic outer surface of the portion of the projection system has an inner edge that defines in part the reservoir.
Public/Granted literature
- US20090059192A1 Lithographic apparatus and device manufacturing method Public/Granted day:2009-03-05
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