Invention Grant
- Patent Title: Internal display port interface test method and device
- Patent Title (中): 内部显示端口接口测试方法和设备
-
Application No.: US13157061Application Date: 2011-06-09
-
Publication No.: US08463965B2Publication Date: 2013-06-11
- Inventor: Dongwon Park , Sunghoon Kim , Sungwon Kim , Chongho Lee
- Applicant: Dongwon Park , Sunghoon Kim , Sungwon Kim , Chongho Lee
- Applicant Address: KR Seoul
- Assignee: LG Display Co., Ltd.
- Current Assignee: LG Display Co., Ltd.
- Current Assignee Address: KR Seoul
- Agency: Brinks Hofer Gilson & Lione
- Priority: KR10-2010-0057454 20100617
- Main IPC: G06F3/00
- IPC: G06F3/00 ; G06F13/00

Abstract:
An iDP interface test method includes transmitting test clocks to an iDP sink device; determining whether or not a link clock lock operation in the iDP sink device is successful based on a measurement result of an HPD signal when a clock lock operation for the test clocks is performed; transmitting test data and arbitrary video data to the iDP sink device if the link clock lock operation in the iDP sink device is successful; determining whether or not a symbol lock operation in the iDP sink device is successful when the symbol lock operation for the test data and the arbitrary video data is performed; and comparing a count result with a predetermined reference value, and determining link stability of the iDP sink device based on the comparison result.
Public/Granted literature
- US20110310252A1 INTERNAL DISPLAY PORT INTERFACE TEST METHOD AND DEVICE Public/Granted day:2011-12-22
Information query