Systems and methods are directed to determining the vacuum integrity within a vacuum package assembly containing an infrared detector, such as within an infrared imaging device. For example for an embodiment, a method of performing a vacuum pressure test on a vacuum package includes changing a first parameter value associated with an infrared detector within the vacuum package to vary a temperature of the infrared detector; measuring a second parameter value associated with the infrared detector based on the changing of the first parameter value; comparing the second parameter value to a threshold value; and determining a vacuum pressure condition of the vacuum package based on the comparing of the second parameter value to the threshold value.