Invention Grant
US08472238B2 Variable resistance nonvolatile storage device with oxygen-deficient oxide layer and asymmetric substrate bias effect
有权
具有氧缺陷氧化层的可变电阻非易失性存储器件和不对称衬底偏置效应
- Patent Title: Variable resistance nonvolatile storage device with oxygen-deficient oxide layer and asymmetric substrate bias effect
- Patent Title (中): 具有氧缺陷氧化层的可变电阻非易失性存储器件和不对称衬底偏置效应
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Application No.: US13534315Application Date: 2012-06-27
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Publication No.: US08472238B2Publication Date: 2013-06-25
- Inventor: Kazuhiko Shimakawa , Yoshihiko Kanzawa , Satoru Mitani , Shunsaku Muraoka
- Applicant: Kazuhiko Shimakawa , Yoshihiko Kanzawa , Satoru Mitani , Shunsaku Muraoka
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2008-134815 20080522
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
The variable resistance nonvolatile storage device includes a memory cell (300) that is formed by connecting in series a variable resistance element (309) including a variable resistance layer (309b) which reversibly changes based on electrical signals each having a different polarity and a transistor (317) including a semiconductor substrate (301) and two N-type diffusion layer regions (302a, 302b), wherein the variable resistance layer (309b) includes an oxygen-deficient oxide of a transition metal, lower and upper electrodes (309a, 309c) are made of materials of different elements, a standard electrode potential V1 of the lower electrode (309a), a standard electrode potential V2 of the upper electrode (309c), and a standard electrode potential Vt of the transition metal satisfy Vt
Public/Granted literature
- US20120281453A1 VARIABLE RESISTANCE NONVOLATILE STORAGE DEVICE Public/Granted day:2012-11-08
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