Invention Grant
US08475042B1 Thermal shield system for high temperature environment XRF metrology tools
有权
用于高温环境XRF计量工具的热屏蔽系统
- Patent Title: Thermal shield system for high temperature environment XRF metrology tools
- Patent Title (中): 用于高温环境XRF计量工具的热屏蔽系统
-
Application No.: US12925366Application Date: 2010-10-20
-
Publication No.: US08475042B1Publication Date: 2013-07-02
- Inventor: Francis Reilly
- Applicant: Francis Reilly
- Applicant Address: US NY Saugerties
- Assignee: Ceres Technologies, Inc.
- Current Assignee: Ceres Technologies, Inc.
- Current Assignee Address: US NY Saugerties
- Main IPC: H05G1/00
- IPC: H05G1/00

Abstract:
A thermal shield for an XRF measurement tool is formed from a heat shield and a heat shield cowling. These components protect the X-ray head assembly that includes the x-ray generation and detection columns and the head control electronics, communications and cooling systems. The heat shield is directly below the X-ray head, parallel to the x-ray head plane and plane of the PV substrate, and perpendicular to the primary beam output from the x-ray head. The heat shield is fabricated of machined copper with several ports machined through the shield. These ports provide a path for primary beam x-rays through the heat shield and for the return of fluoresced X-rays from the PV substrate back to the detector in the X-ray head, while preventing damage to the X-ray head due to the heat emitted from the PV substrate.
Information query