Invention Grant
- Patent Title: Substrate cleaning method and apparatus
- Patent Title (中): 基板清洗方法及装置
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Application No.: US12604686Application Date: 2009-10-23
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Publication No.: US08475602B2Publication Date: 2013-07-02
- Inventor: Hidefumi Matsui , Tsuyoshi Moriya
- Applicant: Hidefumi Matsui , Tsuyoshi Moriya
- Applicant Address: JP Tokyo
- Assignee: Toyko Electron Limited
- Current Assignee: Toyko Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2008-276027 20081027
- Main IPC: B08B6/00
- IPC: B08B6/00 ; B08B11/00

Abstract:
A substrate cleaning method for cleaning and removing foreign materials adhered to a surface of a substrate includes heating the substrate to peel off the foreign materials from the surface of the substrate by a thermal stress, removing the foreign materials from the surface of the substrate by a temperature gradient created in a proximity of the surface of the substrate, and collecting the foreign materials removed from the surface of the substrate by a collecting unit facing the substrate.
Public/Granted literature
- US20100101608A1 SUBSTRATE CLEANING METHOD AND APPARATUS Public/Granted day:2010-04-29
Information query
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