Invention Grant
- Patent Title: Signal capture system and test apparatus including the same
- Patent Title (中): 信号捕获系统和包括其的测试装置
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Application No.: US12840573Application Date: 2010-07-21
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Publication No.: US08476908B2Publication Date: 2013-07-02
- Inventor: Woon-sup Choi , Ho-sun Yoo , In-su Yang , Min-sung Kim , Jong-pill Park , In-ho Choi , Sung-yeol Kim , Jeong-gon Lee , Seung-jun Chee , Jae-il Lee , Chul-woong Jang
- Applicant: Woon-sup Choi , Ho-sun Yoo , In-su Yang , Min-sung Kim , Jong-pill Park , In-ho Choi , Sung-yeol Kim , Jeong-gon Lee , Seung-jun Chee , Jae-il Lee , Chul-woong Jang
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2009-0107516 20091109
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R31/00

Abstract:
A signal capture system for capturing a signal and storing the captured signal in a storage apparatus in real time, and a test apparatus including the signal capture system. The signal capture system includes a printed circuit board; a socket that is connected to the printed circuit board and on which a reference memory component is mounted; and an interposer that is mounted on the printed circuit board, is connected to the socket, an external apparatus, and a storage apparatus, receives first signals from the reference memory component and transmits the received first signals to the external apparatus and the storage apparatus, and receives second signals from the external apparatus and transmits the received second signals to the reference memory component and the storage apparatus, wherein a shape of the socket is defined according to a type of the reference memory component.
Public/Granted literature
- US20110109318A1 SIGNAL CAPTURE SYSTEM AND TEST APPARATUS INCLUDING THE SAME Public/Granted day:2011-05-12
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